Es 330
TID $07: A/F SENSOR HEATER
| TLT | CID | Unit Conversion | Description of Test Data | Description of Test Limit |
|---|---|---|---|---|
| 1 | $01 | Multiply by 0.00017 (A) | Maximum heater current (Bank 1) | Malfunction criterion for A/F sensor heater |
| 1 | $10 | Multiply by 0.00017 (A) | Maximum heater current (Bank 2) | Malfunction criterion for A/F sensor heater |
TID $04: HO2S HEATER
| TLT | CID | Unit Conversion | Description of Test Data | Description of Test Limit |
|---|---|---|---|---|
| 1 | $02 | Multiply by 0.000076 (A) | Maximum HO2S heater current (Bank 1 Sensor 2) | Malfunction threshold for HO2S heater |
| 1 | $20 | Multiply by 0.000076 (A) | Maximum HO2S heater current (Bank 2 Sensor 2) | Malfunction threshold for HO2S heater |
TID $08: THERMOSTAT
| TLT | CID | Unit Conversion | Description of Test Data | Description of Test Limit |
|---|---|---|---|---|
| 1 | $01 | Multiply by 0.625 and subtract 40°C | ECT sensor output when estimated ECT has reached to malfunction criterion | Malfunction criteria for thermostat |
O2S TEST RESULT
| Test ID | Test Item | Description | Unit Conversion | Unit | Standard Value |
|---|---|---|---|---|---|
| $07 | MIN HO2S V | Minimum HO2S voltage | Multiply by 0.005 | V | Less than malfunction threshold |
| $08 | MAX HO2S V | Maximum HO2S voltage | Multiply by 0.005 | V | More than malfunction threshold |
| $31 | Time $31 | HO2S switch time from Lean to Rich | Multiply by 0.04096 | second | Less than malfunction threshold |
| $32 | Time $32 | HO2S switch time from Rich to Lean | Multiply by 0.04096 | second | Less than malfunction threshold |
| $37 | Time $37 | Time that HO2S voltage drops to 0.2 volts after fuel-cut begins | Multiply by 0.04096 | second | Less than malfunction threshold |
| $81 | Time $81 | Percentage in monitor time when HO2S voltage is lower than 0.05 volts | Multiply by 0.3906 | % | Less than malfunction threshold |
| $84 | Time $84 | Percentage in monitor time when HO2S voltage is 0.7 volts or higher | Multiply by 0.3906 | % | More than malfunction threshold |
| $85 | Time $85 | Maximum time while HO2S voltage exceeded 0.45 volts continuously | Multiply by 0.2621 | seconds | More than malfunction threshold |
| $87 | Time $87 | Percentage in monitor time when HO2S voltage is 0.45 volts or higher | Multiply by 0.3906 | % | More than malfunction threshold |
TID $01: CATALYST - SENSOR 1 A/F SENSOR, SENSOR 2 HO2S
| TLT | CID | Unit Conversion | Description of Test Data | Description of Test Limit |
|---|---|---|---|---|
| 0 | $01 | Multiply by 0.0078 (no dimension) | Catalyst deterioration level (bank 1): Determined by waveforms of A/F sensor and HO2S 2 | Malfunction criteria for catalyst deterioration |
| 0 | $02 | Multiply by 0.0078 (no dimension) | Catalyst deterioration level (bank 2): Determined by waveforms of A/F sensor and HO2S 2 | Malfunction criteria for catalyst deterioration |
TID $02: EVAP SYSTEM - LEV II VACUUM MONITOR
| TLT | CID | Unit Conversion | Description of Test Data | Description of Test Limit |
|---|---|---|---|---|
| 1 | $01 | Multiply by 0.183 (mmHg) | Test value of EVAP VSV stuck close: Determined by fuel tank pressure change during vacuum introduction | Malfunction criteria for EVAP VSV stuck closed |
| 0 | $02 | Multiply by 0.0655 (seconds) | Test value of EVAP VSV stuck open: Determined by duration that fuel tank pressure is higher than criteria | Malfunction criteria for EVAP VSV stuck open |
| 0 | $03 | Multiply by 0.0655 (seconds) | Test value of canister closed valve (CCV): Determined by duration that fuel tank pressure is lower than criteria | Malfunction criteria for Canister Closed Valve (CCV) |
| 0 | $04 | Multiply by 0.0458 (mmHg) | Test value 0.04 inch leak: Determined by fuel tank pressure change | Malfunction criteria for 0.04 inch leak |
| 0 | $05 | Multiply by 0.0458 (mmHg) | Test value 0.02 inch leak: Determined by fuel tank pressure change | Malfunction criteria for 0.02 inch leak |
TID $06: A/F SENSOR
| TLT | CID | Unit Conversion | Description of Test Data | Description of Test Limit |
|---|---|---|---|---|
| 0 | $01 | Multiply by 0.000244 (no dimension) | Parameter for identify A/F sensor response rate (Bank 1) | Malfunction threshold for A/F sensor deterioration |
| 0 | $11 | Multiply by 0.000244 (no dimension) | Parameter for identify A/F sensor response rate (Bank 2) | Malfunction threshold for A/F sensor deterioration |